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Conference Paper
Optical Terahertz Science and Technology
Orlando, Florida United States
March 14, 2005
ISBN: 1-55752-786-5
Imaging and Microscopy (TuC)

THz Near-Field Microscopy

Paul C. Planken, Cathalijn E. van Rijmenam, and Nick C. van der Valk

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Abstract

We present results on the spatial extent and origin of the near-field of a metal tip and the first measurement of a phonon resonance in THz apertureless scanning near-field optical microscopy.

© 2005 Optical Society of America

OCIS Codes
(180.0180) Microscopy : Microscopy
(180.5810) Microscopy : Scanning microscopy
(300.0300) Spectroscopy : Spectroscopy
(300.6270) Spectroscopy : Spectroscopy, far infrared

Citation
P. C. Planken, C. E. van Rijmenam, and N. C. van der Valk, " THz Near-Field Microscopy," in Optical Terahertz Science and Technology, Technical Digest (CD) (Optical Society of America, 2005), paper TuC1.
http://www.opticsinfobase.org/abstract.cfm?URI=OTST-2005-TuC1

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