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Conference Paper
Optical Terahertz Science and Technology
Orlando, Florida United States
March 14, 2005
ISBN: 1-55752-786-5
Imaging and Microscopy (TuC)

THz Microscopy of Charge Carrier Distributions

Federico F. Buersgens, R Kersting, and H T. Chen

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Abstract

We report on the application of apertureless THz microscopy for sensing charge carrier distributions in semiconductors on submicron scales. A spatial resolution of less than 1 micron allows for the detection of about 1000 electrons.

© 2005 Optical Society of America

OCIS Codes
(180.0180) Microscopy : Microscopy
(180.5810) Microscopy : Scanning microscopy
(300.0300) Spectroscopy : Spectroscopy
(300.6270) Spectroscopy : Spectroscopy, far infrared

Citation
F. F. Buersgens, R. Kersting, and H. T. Chen, " THz Microscopy of Charge Carrier Distributions," in Optical Terahertz Science and Technology, Technical Digest (CD) (Optical Society of America, 2005), paper TuC2.
http://www.opticsinfobase.org/abstract.cfm?URI=OTST-2005-TuC2


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