Silicon-chip-based optical performance monitoring of THz bandwidth phase and intensity modulated signals

Bill Corcoran; Trung D. Vo; Mark D. Pelusi; Christelle Monat; Adam Densmore; Rubin Ma; Dan-Xia Xu; Siegfried Janz; David. J. Moss; Benjamin J. Eggleton

doi:10.1364/PS.2010.PDPWG3

Integrated Photonics Research, Silicon and Nanophotonics and Photonics in Switching
OSA Technical Digest (CD) (Optica Publishing Group, 2010),
paper PDPWG3
•https://doi.org/10.1364/PS.2010.PDPWG3

Silicon-chip-based optical performance monitoring of THz bandwidth phase and intensity modulated signals

Bill Corcoran, Trung D. Vo, Mark D. Pelusi, Christelle Monat, Adam Densmore, Rubin Ma, Dan-Xia Xu, Siegfried Janz, David. J. Moss, and Benjamin J. Eggleton

Photonics in Switching 2010

Monterey, California United States
25–28 July 2010
ISBN: 978-1-55752-895-7

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B. Corcoran, T. D. Vo, M. D. Pelusi, C. Monat, A. Densmore, R. Ma, D. Xu, S. Janz, D. J. Moss, and B. J. Eggleton, "Silicon-chip-based optical performance monitoring of THz bandwidth phase and intensity modulated signals," in Integrated Photonics Research, Silicon and Nanophotonics and Photonics in Switching, OSA Technical Digest (CD) (Optica Publishing Group, 2010), paper PDPWG3.

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Abstract

We present a silicon-chip-based optical performance monitor, using an all-optical RF spectral analysis technique, capable of real-time performance monitoring both phase and intensity encoded signals. The device operates unimpeded by the effects of photo-generated free-carriers.

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