Antireflective subwavelength structures were parametrized from SEM scans and simulated with the transfer matrix formalism. Such parametric geometry was then refined with a stochastic algorithm (PSO) yielding good agreement with other methodologies.
© 2010 The Optical Society
(050.0050) Diffraction and gratings : Diffraction and gratings
(310.0310) Thin films : Thin films
(310.1210) Thin films : Antireflection coatings
(050.6624) Diffraction and gratings : Subwavelength structures
M. Zocca, "Numerical Modeling and Stochastic Optimization of Dielectric Antireflective Structured Surfaces," in Advanced Photonics & Renewable Energy, OSA Technical Digest (CD) (Optical Society of America, 2010), paper PWB2.