Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > PhAST > 2007 > PTuD > PTuD2
  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
  • OSA Technical Digest (CD) (Optica Publishing Group, 2007),
  • paper PTuD2
  • •https://doi.org/10.1364/PHAST.2007.PTuD2

Compact, high performance femtosecond laser ablation system for trace element analysis

Eric Mottay, Patrick Chabassier, Christophe Pécheyran, Fanny Claverie, and Olivier. F. X. Donard

Not Accessible

Your library or personal account may give you access

Abstract

We present a compact, industrial laser ablation system for trace element analysis. The system uses a high repetition rate femtosecond laser for material ablation and an inductively coupled mass spectrometer for analysis.

© 2007 Optical Society of America

PDF Article
More Like This
Analysis of trace element in solids by using laser ablation atomic fluorescence spectroscopy

M.-K. Kim, H. Ishii, T. Takao, Y. Oki, and M. Maeda
CThO4 Conference on Lasers and Electro-Optics (CLEO:S&I) 2000

Industrial GHz femtosecond laser source for high efficiency ablation

G. Bonamis, K. Mishchik, J. Lopez, I. Manek-Hönninger, E. Audouard, C. Honninger, and E. Mottay
AM2M.4 CLEO: Applications and Technology (CLEO:A&T) 2018

Extremely sensitive element analysis by laser ablation atomic fluorescence spectroscopy

Yuji Oki and Mitsuo Maeda
P31 Conference on Lasers and Electro-Optics/Pacific Rim (CLEO/PR) 1995

View More...
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use