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Optica Publishing Group
  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference
  • Technical Digest (Optica Publishing Group, 2003),
  • paper QWA9

Sub-diffraction-limit imaging based on the topographic contrast of differential confocal microscopy

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Abstract

Using the nanometer topographic sensitivity of differential confocal microscopy, we detect surface features with lateral dimensions smaller than the diffraction limit without fluorescence labeling. Lateral resolution as high as 0.2λ is achieved with maximum-likelihood image restoration.

© 2003 Optical Society of America

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