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Conference Paper
Quantum Electronics and Laser Science Conference
Baltimore, Maryland United States
May 22, 2005
ISBN: 1-55752-770-9
Poster Session III (JThE)

TN-LC Cells as an Elliptical Phase Retarder by Heterodyne Interferometric Ellipsometry

Chien-Chung Tsai, Kuo-Yu Liao, Chien Chou, Chien-Yuan Han, and Yu-Fei Chao

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Abstract

A polarized heterodyne ellipsometer to characterize TN-LC by elliptical parameters of polarization state is proposed. The twist angle and untwisted phase retardation can be measured precisely that TN-LC is verified as an elliptical retarder properly.

© 2005 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(160.0160) Materials : Materials
(160.3710) Materials : Liquid crystals

Citation
C. Tsai, K. Liao, C. Chou, C. Han, and Y. Chao, "TN-LC Cells as an Elliptical Phase Retarder by Heterodyne Interferometric Ellipsometry," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2005), paper JThE7.
http://www.opticsinfobase.org/abstract.cfm?URI=QELS-2005-JThE7


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