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Conference Paper
Quantum Electronics and Laser Science Conference
Baltimore, Maryland United States
May 22, 2005
ISBN: 1-55752-770-9
Poster Session III (JThE)

Calculation of Power Density Directly from Diffraction Integrals

Seung-Whan Bahk, Victor Yanovsky, and Gerard Mourou

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Abstract

Direct intensity characterization from diffraction integrals is a promising technique for evaluating ultra-high field. The energy and momentum conservation for vector diffraction field are discussed to clarify the role of longitudinal field in the calculation.

© 2005 Optical Society of America

OCIS Codes
(050.0050) Diffraction and gratings : Diffraction and gratings
(050.1960) Diffraction and gratings : Diffraction theory
(320.0320) Ultrafast optics : Ultrafast optics
(320.7090) Ultrafast optics : Ultrafast lasers

Citation
S. Bahk, V. Yanovsky, and G. Mourou, "Calculation of Power Density Directly from Diffraction Integrals," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2005), paper JThE84.
http://www.opticsinfobase.org/abstract.cfm?URI=QELS-2005-JThE84


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