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Conference Paper
Quantum Electronics and Laser Science Conference
Baltimore, Maryland United States
May 22, 2005
ISBN: 1-55752-770-9
Poster Session I (JTuC)

Using Thermal Profiling to Quantify Optical Feedback into Semiconductor Lasers

Evelyn Kapusta, Dietrich Lueerssen, and Janice Hudgings

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Abstract

Thermal profiling is an ideal technique for monitoring optical feedback into semiconductor lasers in photonic integrated circuits. Quantitative measurements of optical output power, optical feedback magnitude, and threshold current shift are obtained without optical measurements.

© 2005 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.6780) Instrumentation, measurement, and metrology : Temperature
(140.0140) Lasers and laser optics : Lasers and laser optics
(140.5960) Lasers and laser optics : Semiconductor lasers

Citation
E. Kapusta, D. Lueerssen, and J. Hudgings, "Using Thermal Profiling to Quantify Optical Feedback into Semiconductor Lasers," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2005), paper JTuC78.
http://www.opticsinfobase.org/abstract.cfm?URI=QELS-2005-JTuC78


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