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Conference Paper
Quantum Electronics and Laser Science Conference
Baltimore, Maryland United States
May 22, 2005
ISBN: 1-55752-770-9
Poster Session II (JWB)

Atogram and Nanometer Trace Element Detection from Solid Surface by Soft Laser Ablation Atomic Fluorescence Spectroscopy

Daisuke Nakamura, Yuji Oki, Takayuki Takao, and Mitsuo Maeda

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Abstract

Ultimate high sensitivity of trace element detection was proposed and demonstrated by solid surface analysis with laser ablation spectroscopy.Numerical calculation predicts LOD of atogram and 290ag was obtained experimentally about sodium in PMMA.

© 2005 Optical Society of America

OCIS Codes
(240.0240) Optics at surfaces : Optics at surfaces
(240.6490) Optics at surfaces : Spectroscopy, surface
(300.0300) Spectroscopy : Spectroscopy
(300.6210) Spectroscopy : Spectroscopy, atomic

Citation
D. Nakamura, Y. Oki, T. Takao, and M. Maeda, "Atogram and Nanometer Trace Element Detection from Solid Surface by Soft Laser Ablation Atomic Fluorescence Spectroscopy," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2005), paper JWB8.
http://www.opticsinfobase.org/abstract.cfm?URI=QELS-2005-JWB8


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