We describe an approach for characterizing optical quantum gates, by constructing models which incorporate mode-matching effects. Quantum process tomography is then performed on the model. The techniques can be generalized to other quantum computing architectures.
© 2005 Optical Society of America
P. P. Rohde, G. J. Pryde, J. L. O'Brien, and T. C. Ralph, "Quantum Gate Characterization in an Extended Hilbert Space," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2005), paper QMA4.