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Conference Paper
Quantum Electronics and Laser Science Conference
Baltimore, Maryland United States
May 22, 2005
ISBN: 1-55752-770-9
Nanoimaging and Spectroscopy (QTuK)

Characterization and Scanning-Probe-Spectroscopy of Radiation Pressure Induced Micro-Mechanical Oscillation of a Microcavity

Tobias J. Kippenberg, Hossein Rokhsari, Tal Carmon, and Kerry J. Vahala

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Abstract

Microcavities can enter a regime where radiation pressure causes oscillation of mechanical cavity eigenmodes. We present a detailed experimental and theoretical understanding of this effect, and report direct scanning probe spectroscopy of the micromechanical modes.

© 2005 Optical Society of America

OCIS Codes
(180.0180) Microscopy : Microscopy
(180.5810) Microscopy : Scanning microscopy
(190.0190) Nonlinear optics : Nonlinear optics
(190.4360) Nonlinear optics : Nonlinear optics, devices

Citation
T. J. Kippenberg, H. Rokhsari, T. Carmon, and K. J. Vahala, "Characterization and Scanning-Probe-Spectroscopy of Radiation Pressure Induced Micro-Mechanical Oscillation of a Microcavity," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2005), paper QTuK6.
http://www.opticsinfobase.org/abstract.cfm?URI=QELS-2005-QTuK6


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