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Conference Paper
Quantum Electronics and Laser Science Conference
Baltimore, Maryland United States
May 22, 2005
ISBN: 1-55752-770-9
Terahertz Spectroscopy (QWC)

Terahertz Near-Field Microscopy

Paul Planken, Cathalijn van Rijmenam, and Nick van der Valk

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Abstract

We present results on the spatial extent and origin of the near-field of a metal tip and the first measurement on a crystal of CsI using THz apertureless scanning near-field optical microscopy.

© 2005 Optical Society of America

OCIS Codes
(180.0180) Microscopy : Microscopy
(180.5810) Microscopy : Scanning microscopy
(300.0300) Spectroscopy : Spectroscopy
(300.6270) Spectroscopy : Spectroscopy, far infrared

Citation
P. Planken, C. van Rijmenam, and N. van der Valk, "Terahertz Near-Field Microscopy," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2005), paper QWC1.
http://www.opticsinfobase.org/abstract.cfm?URI=QELS-2005-QWC1


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