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Optics InfoBase > Conference Papers > QELS > 2006 > JTuD > Page JTuD67 © 2006 OSA

Conference Paper
Quantum Electronics and Laser Science Conference
Long Beach, California United States
May 21, 2006
ISBN: 1-55752-813-6
Joint CLEO/QELS Poster Session I (JTuD)

Novel Technique to Remove Measurement Noise Generated by Pinhole Diffraction Phenomenon

Youngchun Youk

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Abstract

We have developed a novel technique to remove measurement noise generated by pinhole diffraction in confocal microscopy. We compared the refractive index measurement results using our technique with those obtained using a traditional system.

© 2006 Optical Society of America

OCIS Codes
(180.0180) Microscopy : Microscopy
(180.1790) Microscopy : Confocal microscopy
(290.0290) Scattering : Scattering
(290.3030) Scattering : Index measurements

Citation
Y. Youk, "Novel Technique to Remove Measurement Noise Generated by Pinhole Diffraction Phenomenon," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2006), paper JTuD67.
http://www.opticsinfobase.org/abstract.cfm?URI=QELS-2006-JTuD67


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