We have developed a novel technique to remove measurement noise generated by pinhole diffraction in confocal microscopy. We compared the refractive index measurement results using our technique with those obtained using a traditional system.
© 2006 Optical Society of America
Y. Youk, "Novel Technique to Remove Measurement Noise Generated by Pinhole Diffraction Phenomenon," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2006), paper JTuD67.
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