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Conference Paper
Quantum Electronics and Laser Science Conference
Long Beach, California United States
May 21, 2006
ISBN: 1-55752-813-6
Metamaterials II (QThN)

Subdiffraction Focusing of Scanning Beams by Combined Nonlinear and Negative-Refraction Layers

Anton Husakou and Joachim Herrmann

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Abstract

The possibility to focus a light beam below the diffraction limit, using a Kerr-type nonlinear medium to create seed evanescent components, and a photonic crystal with negative refraction to amplify them, is theoretically predicted.

© 2006 Optical Society of America

OCIS Codes
(070.0070) Fourier optics and signal processing : Fourier optics and signal processing
(070.2580) Fourier optics and signal processing : Paraxial wave optics
(220.0220) Optical design and fabrication : Optical design and fabrication
(220.2560) Optical design and fabrication : Propagating methods

Citation
A. Husakou and J. Herrmann, "Subdiffraction Focusing of Scanning Beams by Combined Nonlinear and Negative-Refraction Layers," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2006), paper QThN6.
http://www.opticsinfobase.org/abstract.cfm?URI=QELS-2006-QThN6


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