NSOM spectroscopy and imaging of nanoparticles in both illumination and collection mode were studied. The artifacts of red-shifting in NSOM spectra and polarization dependant dark fringe patterns associated with each scattering resonant peak were explained.
© 2008 Optical Society of America
S. Chang and Y. Chang, "Artifacts in Near-Field Scanning Optical Microscope Spectroscopy and Imaging of Nanoparticles," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, OSA Technical Digest (CD) (Optical Society of America, 2008), paper JThA125.
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