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Conference Paper
Quantum Electronics and Laser Science Conference
San Jose, California United States
May 4-9, 2008
ISBN: 978-1-55752-859-9
CLEO/QELS Poster Session III (JThA)

Artifacts in Near-Field Scanning Optical Microscope Spectroscopy and Imaging of Nanoparticles

Shih-Hui Chang and Yun-Chorng Chang

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Abstract

NSOM spectroscopy and imaging of nanoparticles in both illumination and collection mode were studied. The artifacts of red-shifting in NSOM spectra and polarization dependant dark fringe patterns associated with each scattering resonant peak were explained.

© 2008 Optical Society of America

OCIS Codes
(180.0180) Microscopy : Microscopy
(300.0300) Spectroscopy : Spectroscopy
(300.6490) Spectroscopy : Spectroscopy, surface
(180.4243) Microscopy : Near-field microscopy

Citation
S. Chang and Y. Chang, "Artifacts in Near-Field Scanning Optical Microscope Spectroscopy and Imaging of Nanoparticles," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, OSA Technical Digest (CD) (Optical Society of America, 2008), paper JThA125.
http://www.opticsinfobase.org/abstract.cfm?URI=QELS-2008-JThA125


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