Flexible optical probe for planar lightwave circuits testing

Abdullah J Zakariya; Tao Liu; Jose Martinez; Roberto Panepucci

Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
OSA Technical Digest (CD) (Optica Publishing Group, 2008),
paper JWA83

Flexible optical probe for planar lightwave circuits testing

Abdullah J Zakariya, Tao Liu, Jose Martinez, and Roberto Panepucci

Quantum Electronics and Laser Science Conference 2008

San Jose, California United States
4–9 May 2008
ISBN: 978-1-55752-859-9

From the session
CLEO/QELS Poster Session II (JWA)

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A. J. Zakariya, T. Liu, J. Martinez, and R. Panepucci, "Flexible optical probe for planar lightwave circuits testing," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, OSA Technical Digest (CD) (Optica Publishing Group, 2008), paper JWA83.

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Abstract

A flexible optical probe that accomplishes wafer-level directional coupling of light into optical waveguides is investigated optically and mechanically. Unoptimized directional coupling efficiency of 4% was achieved into an S-shaped polymer test waveguide.

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