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Conference Paper
Quantum Electronics and Laser Science Conference
Baltimore, Maryland United States
May 1-6, 2011
ISBN: 978-1-55752-910-7
Optical Processes in Graphene (QTuK)

Identifying Edge Chirality of Graphene Using Polarization Resolved μ-Raman Spectroscopy

Milan Begliarbekov, Onejae Sul, Sokratis Kalliakos, Eui-Hyeok Yang, and Stefan Strauf  »View Author Affiliations


http://dx.doi.org/10.1364/QELS.2011.QTuK7


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Abstract

Development of optoelectronic devices based on the bandgap of nanosctructured graphene requires knowledge of edge chirality. We show that polarization resolved Raman spectroscopy can be used to determine the fractional edge composition of graphene.

© 2011 OSA

OCIS Codes
(180.1790) Microscopy : Confocal microscopy
(300.6450) Spectroscopy : Spectroscopy, Raman
(180.5655) Microscopy : Raman microscopy

Citation
M. Begliarbekov, O. Sul, S. Kalliakos, E. Yang, and S. Strauf, "Identifying Edge Chirality of Graphene Using Polarization Resolved μ-Raman Spectroscopy," in CLEO:2011 - Laser Applications to Photonic Applications, OSA Technical Digest (CD) (Optical Society of America, 2011), paper QTuK7.
http://www.opticsinfobase.org/abstract.cfm?URI=QELS-2011-QTuK7


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