A wavelength scanning interferometry system is used to measure all the orthogonal components of the displacement field inside semitransparent scattering materials
© 2013 OSA
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry
P. D. Ruiz, "Tomographic Sensing of Displacement Fields," in Advanced Photonics 2013, K. Ewing and M. Ferreira, eds., OSA Technical Digest (online) (Optical Society of America, 2013), paper SW3D.2.
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