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Conference Paper
Ultrafast Electronics and Optoelectronics
Snowmass, Colorado United States
April 14, 1999
ISBN: 1-55752-604-4
Ultrafast Electronics (UThC)

On-wafer testing of circuits through 220 GHz

Todd Gaier, Lorene Samoska, Charles Oleson, and Greg Boll

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No abstract available.

OCIS Codes
(000.2170) General : Equipment and techniques
(000.3110) General : Instruments, apparatus, and components common to the sciences
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3940) Instrumentation, measurement, and metrology : Metrology
(160.6000) Materials : Semiconductor materials
(320.7080) Ultrafast optics : Ultrafast devices
(320.7100) Ultrafast optics : Ultrafast measurements

T. Gaier, L. Samoska, C. Oleson, and G. Boll, "On-wafer testing of circuits through 220 GHz," in Ultrafast Electronics and Optoelectronics, J. Bowers and W. Knox, eds., Vol. 28 of OSA Trends in Optics and Photonics (Optical Society of America, 1999), paper UThC5.

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