No abstract available.
(000.2170) General : Equipment and techniques
(000.3110) General : Instruments, apparatus, and components common to the sciences
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3940) Instrumentation, measurement, and metrology : Metrology
(160.6000) Materials : Semiconductor materials
(320.7080) Ultrafast optics : Ultrafast devices
(320.7100) Ultrafast optics : Ultrafast measurements
T. Gaier, L. Samoska, C. Oleson, and G. Boll, "On-wafer testing of circuits through 220 GHz," in Ultrafast Electronics and Optoelectronics, J. Bowers and W. Knox, eds., Vol. 28 of OSA Trends in Optics and Photonics (Optical Society of America, 1999), paper UThC5.
References are not available for this paper.