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Conference Paper
Ultrafast Electronics and Optoelectronics
Snowmass, Colorado United States
April 14, 1999
ISBN: 1-55752-604-4
Imaging and Internal Probing of Ultrafast Circuits (UWB)

Chips at work: Picosecond Imaging Circuit Analysis

J.A. Kash and J.C. Tsang

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No abstract available.

OCIS Codes
(320.5390) Ultrafast optics : Picosecond phenomena
(320.7100) Ultrafast optics : Ultrafast measurements

Citation
J. A. Kash and J. C. Tsang, "Chips at work: Picosecond Imaging Circuit Analysis," in Ultrafast Electronics and Optoelectronics, J. Bowers and W. Knox, eds., Vol. 28 of OSA Trends in Optics and Photonics (Optical Society of America, 1999), paper UWB2.
http://www.opticsinfobase.org/abstract.cfm?URI=UEO-1999-UWB2


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