We measure the insulator-to-metal transition in VO2 using time-resolved Near-Edge X-ray Absorption. Picosecond pulses of synchrotron radiation are used to detect the red-shift in the Vanadium L3 edge at 516 eV, associated with bandgap collapse.
© 2004 Optical Society of America
(320.0320) Ultrafast optics : Ultrafast optics
(320.7130) Ultrafast optics : Ultrafast processes in condensed matter, including semiconductors
(340.0340) X-ray optics : X-ray optics
(340.6720) X-ray optics : Synchrotron radiation
A. Cavalleri, H. Chong, S. Fourmaux, E. Glover, P. Heimann, J. C. Kieffer, H. Padmore, and R. Schoenlein, "Ultrafast near edge X-ray absorption measurement of the insulator-to-metal transition in VO2," in 14th International Conference on Ultrafast Phenomena, Technical Digest (CD) (Optical Society of America, 2004), paper WC5.