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Conference Paper
International Conference on Ultrafast Phenomena
Snowmass Village, Colorado United States
July 18-23, 2010
ISBN: 978-1-55752-894-0
Poster Session II (Continued) (TuE)

Soft X-Ray Interferometer for Time-Resolved Diagnostics of Laser-Aided Nano-Fabrication

Tohru Suemoto, Kota Terakawa, Yasuo Minami, Yoshihiro Ochi, Noboru Hasegawa, Tetsuya Kawachi, Takuro Tomita, Minoru Yamamoto, and Manato Deki

http://dx.doi.org/10.1364/UP.2010.TuE1


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Abstract

An interferometer is constructed utilizing 13.9 nm radiation from a plasma-based soft X-ray laser. Single-shot measurement with a time-resolution of 7 ps is performed to observe the initial stage of the ablation process in platinum.

© 2010 OSA

OCIS Codes
(320.0320) Ultrafast optics : Ultrafast optics
(320.5390) Ultrafast optics : Picosecond phenomena
(340.0340) X-ray optics : X-ray optics
(340.7480) X-ray optics : X-rays, soft x-rays, extreme ultraviolet (EUV)

Citation
T. Suemoto, K. Terakawa, Y. Minami, Y. Ochi, N. Hasegawa, T. Kawachi, T. Tomita, M. Yamamoto, and M. Deki, "Soft X-Ray Interferometer for Time-Resolved Diagnostics of Laser-Aided Nano-Fabrication," in International Conference on Ultrafast Phenomena, OSA Technical Digest (CD) (Optical Society of America, 2010), paper TuE1.
http://www.opticsinfobase.org/abstract.cfm?URI=UP-2010-TuE1


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