Abstract
Analytic expressions for the eigenvalues for the four-wave components at an oblique angle of light incidence inside a randomly oriented anisotropic magneto-optic dielectric medium are reported explicitly. In particular, these solutions are valid as long as the dielectric function tensor consists of a symmetric and an antisymmetric part. The normalized Jones reflection and transmission coefficients, i.e., the generalized ellipsometric parameters of homogeneously layered systems having nonsymmetric dielectric properties, are obtained immediately from a recently reviewed 4 × 4 matrix approach. Our explicit solutions allow a future analysis of the generalized ellipsometric data of multilayered magneto-optic media regardless of the orientation of the material magnetization and crystalline axes and the angle of light incidence. Possible experimental thin-film situations are discussed in terms of generalized ellipsometric parameters and illustrated for birefringent free-carrier effects in heavily doped semiconductor thin films and for oblique magnetization directions in magneto-optic multilayer systems.
© 1999 Optical Society of America
Full Article | PDF ArticleMore Like This
Aotmane En Naciri, Luc Johann, Roland Kleim, Manuel Sieskind, and Marianne Amann
Appl. Opt. 38(4) 647-654 (1999)
Štefan Višňovský, Kamil Postava, Tomuo Yamaguchi, and Radek Lopušník
Appl. Opt. 41(19) 3950-3960 (2002)
Y. S. Dadoenkova, I. L. Lyubchanskii, Y. P. Lee, and T. Rasing
J. Opt. Soc. Am. B 31(3) 626-630 (2014)