Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Combination of scene-based and stochastic measurement for wide-field aberration correction in microscopic imaging

Not Accessible

Your library or personal account may give you access

Abstract

We report on a novel aberration correction technique that uses the sequential combination of two different aberration measurement methods to correct for setup-induced and specimen-induced aberrations. The advantages of both methods are combined and, thus, the measurement time is strongly reduced without loss of accuracy. The technique is implemented using a spatial-light-modulator-based wide-field microscope without the need for additional components (e.g., a Shack–Hartmann sensor). The aberrations are measured without a reference object by directly using the specimen to be imaged. We demonstrate experimental results for technical as well as biological specimens.

© 2010 Optical Society of America

Full Article  |  PDF Article
More Like This
Correction of aberration in holographic optical tweezers using a Shack-Hartmann sensor

Carol López-Quesada, Jordi Andilla, and Estela Martín-Badosa
Appl. Opt. 48(6) 1084-1090 (2009)

Image-based calibration of a deformable mirror in wide-field microscopy

Diwakar Turaga and Timothy E. Holy
Appl. Opt. 49(11) 2030-2040 (2010)

Wavefront aberration measurements and corrections through thick tissue using fluorescent microsphere reference beacons

Oscar Azucena, Justin Crest, Jian Cao, William Sullivan, Peter Kner, Donald Gavel, Daren Dillon, Scot Olivier, and Joel Kubby
Opt. Express 18(16) 17521-17532 (2010)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (9)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved