Abstract
Antimony-based bismuth-doped thin film, a new kind of super-resolution mask
layer, is prepared by magnetron sputtering. The structures and optical constants of
the thin films before and after annealing are examined in detail. The as-deposited
film is mainly in an amorphous state. After annealing at 170-370 oC, it is converted
to the rhombohedral-type of structure. The extent of crystallization increased with
the annealing temperature. When the thin film is annealed, its refractive index
decreased in the most visible region, whereas the extinction coefficient and
reflectivity are markedly increased. The results indicate that the optical
parameters of the film strongly depend on its microstructure and the bonding of the
atoms.
© 2011 Chinese Optics Letters
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