Abstract

Ultra-thin curved transmission crystals operating in the Cauchois spectrometer geometry were evaluated for the purpose of achieving high spectral resolution in the 6–13 keV x-ray energy range. The crystals were silicon (111) and sapphire R-cut wafers, each 18 μm thick, and a silicon (100) wafer of 50-μm thickness. The W ${\mathrm{L}\alpha }_1$ spectral line at 8.398 keV from a laboratory source was used to evaluate the resolution. The highest crystal resolving power, $E/\mathrm{\Delta }E=6300$, was achieved by diffraction from the (33-1) planes of the Si(100) wafer that was cylindrically bent to a radius of curvature of 254 mm, where the (33-1) planes have an asymmetric angle of 13.26° from the normal of the crystal surface facing the x-ray source. This work demonstrates the ability to measure highly resolved line shapes of the K transitions of the elements Fe through Kr and the L transitions of the elements Gd through Th using a relatively compact spectrometer optical system and readily available thin commercial wafers. The intended application is as a diagnostic of laser-produced plasmas where the presence of multiple charged states and broadenings from high temperature and density requires high-resolution methods that are robust in a noisy source environment.

High x-ray resolving power utilizing asymmetric diffraction from a quartz transmission crystal measured in the 6  keV to 22  keV energy range

John F. Seely, Eric Galtier, Lawrence T. Hudson, Albert Henins, and Uri Feldman
Appl. Opt. 58(19) 5225-5232 (2019)

Efficiency calibrations of cylindrically bent transmission crystals in the 20 to 80 keV x-ray energy range

Csilla I. Szabo, Uri Feldman, Stephen Seltzer, Lawrence T. Hudson, Michelle O’Brien, Hye-Sook Park, and John F. Seely
Opt. Lett. 36(8) 1335-1337 (2011)

Enhanced x-ray resolving power achieved behind the focal circles of Cauchois spectrometers

John F. Seely, Lawrence T. Hudson, Glenn E. Holland, and Albert Henins
Appl. Opt. 47(15) 2767-2778 (2008)

Spatial resolution of a hard x-ray CCD detector

John F. Seely, Nino R. Pereira, Bruce V. Weber, Joseph W. Schumer, John P. Apruzese, Lawrence T. Hudson, Csilla I. Szabo, Craig N. Boyer, and Scott Skirlo
Appl. Opt. 49(23) 4372-4378 (2010)

High-efficiency B₄C/Mo₂C alternate multilayer grating for monochromators in the photon energy range from 0.7 to 3.4  keV

Fadi Choueikani, Bruno Lagarde, Franck Delmotte, Michael Krumrey, Françoise Bridou, Muriel Thomasset, Evgueni Meltchakov, and François Polack
Opt. Lett. 39(7) 2141-2144 (2014)