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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 33, Iss. 21 — Jul. 20, 1994
  • pp: 4536–4946

Optics InfoBase > Applied Optics > Volume 33 > Issue 21 > Table of Contents

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  • Applied Optics, Vol. 33, Iss. 21, pp. 4535–4536 (1994)
  • James A. Lock and Craig F. Bohren

  • Applied Optics, Vol. 33, Iss. 21, pp. 4537–4538 (1994)
  • Marko Riikonen and Jukka Ruoskanen

  • Applied Optics, Vol. 33, Iss. 21, pp. 4539–4547 (1994)
  • Alistair B. Fraser

  • Applied Optics, Vol. 33, Iss. 21, pp. 4548–4551 (1994)
  • Pekka Parviainen, Craig F. Bohren, and Veikko Mäkelä

  • Applied Optics, Vol. 33, Iss. 21, pp. 4552–4562 (1994)
  • Eberhard Tränkle and Bernd Mielke

  • Applied Optics, Vol. 33, Iss. 21, pp. 4563–4568 (1994)
  • Michael V. Berry

  • Applied Optics, Vol. 33, Iss. 21, pp. 4569–4579 (1994)
  • G. P. Können, Sara H. Muller, and J. Tinbergen

  • Applied Optics, Vol. 33, Iss. 21, pp. 4580–4589 (1994)
  • David K. Lynch, Stanley D. Gedzelman, and Alistair B. Fraser

  • Applied Optics, Vol. 33, Iss. 21, pp. 4590–4601 (1994)
  • Kenneth Sassen, Nancy C. Knight, Yoshihide Takano, and Andrew J. Heymsfield

  • Applied Optics, Vol. 33, Iss. 21, pp. 4602–4606 (1994)
  • Kenneth Sassen, Thomas Peter, Beiping P. Luo, and Paul J. Crutzen

  • Applied Optics, Vol. 33, Iss. 21, pp. 4607–4613 (1994)
  • Stanley David Gedzelman

  • Applied Optics, Vol. 33, Iss. 21, pp. 4614–4619 (1994)
  • Edward H. Geyer, M. Hoffmann, and H. Volland

  • Applied Optics, Vol. 33, Iss. 21, pp. 4620–4628 (1994)
  • Raymond L. Lee

  • Applied Optics, Vol. 33, Iss. 21, pp. 4629–4638 (1994)
  • Raymond L. Lee

  • Applied Optics, Vol. 33, Iss. 21, pp. 4639–4643 (1994)
  • Waldemar H. Lehn, Wayne K. Silvester, and David M. Fraser

  • Applied Optics, Vol. 33, Iss. 21, pp. 4644–4651 (1994)
  • Peter D. Sozou and George Loizou

  • Applied Optics, Vol. 33, Iss. 21, pp. 4652–4662 (1994)
  • James D. Spinhirne and Teruyuki Nakajima

  • Applied Optics, Vol. 33, Iss. 21, pp. 4663–4671 (1994)
  • James A. Lock and Chin-Lien Chiu

  • Applied Optics, Vol. 33, Iss. 21, pp. 4672–4676 (1994)
  • John J. D'Amico, Marcus D. Knudson, and Dean S. Langley

  • Applied Optics, Vol. 33, Iss. 21, pp. 4677–4690 (1994)
  • James A. Lock, J. Michael Jamison, and Chih-Yang Lin

  • Applied Optics, Vol. 33, Iss. 21, pp. 4691–4696 (1994)
  • Gregory Kaduchak, Philip L. Marston, and Harry J. Simpson

  • Applied Optics, Vol. 33, Iss. 21, pp. 4697–4701 (1994)
  • Gregory Kaduchak and Philip L. Marston

  • Applied Optics, Vol. 33, Iss. 21, pp. 4702–4713 (1994)
  • Philip L. Marston and Gregory Kaduchak

  • Applied Optics, Vol. 33, Iss. 21, pp. 4714–4718 (1994)
  • Michael V. Berry and A. N. Wilson

  • Applied Optics, Vol. 33, Iss. 21, pp. 4719–4722 (1994)
  • Michael E. Churma

  • Applied Optics, Vol. 33, Iss. 21, pp. 4723–4726 (1994)
  • J. T. Enright

  • Applied Optics, Vol. 33, Iss. 21, pp. 4727–4732 (1994)
  • John N. Kidder

  • Applied Optics, Vol. 33, Iss. 21, pp. 4733–4740 (1994)
  • Jeffery R. Linskens and Craig F. Bohren

  • Applied Optics, Vol. 33, Iss. 21, pp. 4741–4748 (1994)
  • George Smith, Algis J. Vingrys, Jennifer D. Maddocks, and Christopher P. Hely

  • Applied Optics, Vol. 33, Iss. 21, pp. 4749–4753 (1994)
  • Claes Beckman, Olle Nilsson, and Lars-Erik Paulsson

  • Applied Optics, Vol. 33, Iss. 21, pp. 4754–4755 (1994)
  • Curt Roslund and Claes Beekman

  • Applied Optics, Vol. 33, Iss. 21, pp. 4756–4760 (1994)
  • Kenneth Sassen

  • Applied Optics, Vol. 33, Iss. 21, pp. 4761–4770 (1994)
  • Waltraud Pichler and Walter R. Leeb

  • Applied Optics, Vol. 33, Iss. 21, pp. 4771–4775 (1994)
  • Haiyin Sun, Steve Menhart, and Alois Adams

  • Applied Optics, Vol. 33, Iss. 21, pp. 4776–4780 (1994)
  • Midori Kato, Masashi Kiguchi, and Yoshio Taniguchi

  • Applied Optics, Vol. 33, Iss. 21, pp. 4781–4791 (1994)
  • Y. Lin, T. J. Kessler, and G. N. Lawrence

  • Applied Optics, Vol. 33, Iss. 21, pp. 4792–4800 (1994)
  • L. Buydens and P. Demeester

  • Applied Optics, Vol. 33, Iss. 21, pp. 4801–4806 (1994)
  • J. C. Martín and M. P. Bernal

  • Applied Optics, Vol. 33, Iss. 21, pp. 4807–4813 (1994)
  • S. Hava, M. Auslender, and D. Rabinovich

  • Applied Optics, Vol. 33, Iss. 21, pp. 4814–4824 (1994)
  • Philippe Gerard, Pierre Benech, Diaa A. M. Khalil, and Roger Rimet

  • Applied Optics, Vol. 33, Iss. 21, pp. 4825–4834 (1994)
  • Dariusz Stramski and Marián Sedlák

  • Applied Optics, Vol. 33, Iss. 21, pp. 4835–4840 (1994)
  • Xin Xu and George W. Kattawar

  • Applied Optics, Vol. 33, Iss. 21, pp. 4841–4850 (1994)
  • Bruce W. Forgan

  • Applied Optics, Vol. 33, Iss. 21, pp. 4851–4867 (1994)
  • Robert A. Toth

  • Applied Optics, Vol. 33, Iss. 21, pp. 4868–4879 (1994)
  • Robert A. Toth

  • Applied Optics, Vol. 33, Iss. 21, pp. 4880–4888 (1994)
  • Byron M. Welsh and Steven C. Koeffler

  • Applied Optics, Vol. 33, Iss. 21, pp. 4889–4898 (1994)
  • Asa Fein, Jeffrey S. Bernstein, Xiao-Mei Song, and Terrill A. Cool

  • Applied Optics, Vol. 33, Iss. 21, pp. 4899–4905 (1994)
  • A. Madrazo, F. González, and F. Moreno

  • Applied Optics, Vol. 33, Iss. 21, pp. 4906–4918 (1994)
  • Foeke Kuik, Johan F. de Haan, and Joop W. Hovenier

  • Applied Optics, Vol. 33, Iss. 21, pp. 4919–4929 (1994)
  • Frank W. Gibson

  • Applied Optics, Vol. 33, Iss. 21, pp. 4930–4937 (1994)
  • S. Arnon and N. S. Kopeika

  • Applied Optics, Vol. 33, Iss. 21, pp. 4938–4946 (1994)
  • George B. Jarvis, Sam Mathew, and Jonathan E. Kenny

  • Applied Optics, Vol. 33, Iss. 21, pp. 4953–4964 (1994)
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