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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 16 — Jun. 1, 2003
  • pp: 2869–3329

Optics InfoBase > Applied Optics > Volume 42 > Issue 16 > Table of Contents

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  • Applied Optics, Vol. 42, Iss. 16, pp. 2869–2870 (2003)
  • Jeremy C. Hebden, David A. Boas, John S. George, and Anthony J. Durkin

  • Applied Optics, Vol. 42, Iss. 16, pp. 2871–2880 (2003)
  • Alois K. Popp, Megan T. Valentine, Peter D. Kaplan, and David A. Weitz

  • Applied Optics, Vol. 42, Iss. 16, pp. 2881–2887 (2003)
  • Yuich Fukui, Yusaku Ajichi, and Eiji Okada

  • Applied Optics, Vol. 42, Iss. 16, pp. 2888–2896 (2003)
  • Toshiyuki Hayashi, Yoshihiko Kashio, and Eiji Okada

  • Applied Optics, Vol. 42, Iss. 16, pp. 2897–2905 (2003)
  • Zhixiong Guo and Kyunghan Kim

  • Applied Optics, Vol. 42, Iss. 16, pp. 2906–2914 (2003)
  • Eiji Okada and David T. Delpy

  • Applied Optics, Vol. 42, Iss. 16, pp. 2915–2921 (2003)
  • Eiji Okada and David T. Delpy

  • Applied Optics, Vol. 42, Iss. 16, pp. 2923–2930 (2003)
  • Claudia E. W. Gributs and David H. Burns

  • Applied Optics, Vol. 42, Iss. 16, pp. 2931–2939 (2003)
  • Guoqiang Yu, Turgut Durduran, Daisuke Furuya, Joel H. Greenberg, and Arjun G. Yodh

  • Applied Optics, Vol. 42, Iss. 16, pp. 2940–2950 (2003)
  • David J. Cuccia, Frederic Bevilacqua, Anthony J. Durkin, Sean Merritt, Bruce J. Tromberg, Gultekin Gulsen, Hon Yu, Jun Wang, and Orhan Nalcioglu

  • Applied Optics, Vol. 42, Iss. 16, pp. 2951–2959 (2003)
  • Sean Merritt, Frederic Bevilacqua, Anthony J. Durkin, David J. Cuccia, Ryan Lanning, Bruce J. Tromberg, Gultekin Gulsen, Hon Yu, Jun Wang, and Orhan Nalcioglu

  • Applied Optics, Vol. 42, Iss. 16, pp. 2960–2967 (2003)
  • Yueqing Gu, Vincent A. Bourke, Jae G. Kim, Anca Constantinescu, Ralph P. Mason, and Hanli Liu

  • Applied Optics, Vol. 42, Iss. 16, pp. 2968–2971 (2003)
  • Maureen Johns and Hanli Liu

  • Applied Optics, Vol. 42, Iss. 16, pp. 2972–2978 (2003)
  • Xin-Cheng Yao, David M Rector, and John S. George

  • Applied Optics, Vol. 42, Iss. 16, pp. 2979–2986 (2003)
  • Claudia Mujat, Monique H. van der Veen, Jan L. Ruben, Jaap J. ten Bosch, and Aristide Dogariu

  • Applied Optics, Vol. 42, Iss. 16, pp. 2987–2994 (2003)
  • De-Kui Qing, M. Pinar Mengüç, Fred A. Payne, and Mary-Grace C. Danao

  • Applied Optics, Vol. 42, Iss. 16, pp. 2995–3004 (2003)
  • Jan Siegel, Daniel S. Elson, Stephen E. D. Webb, K. C. Benny Lee, Alexis Vlandas, Giovanni L. Gambaruto, Sandrine Lévêque-Fort, M. John Lever, Paul J. Tadrous, Gordon W. H. Stamp, Andrew L. Wallace, Ann Sandison, Tim F. Watson, Fernando Alvarez, and Paul M. W. French

  • Applied Optics, Vol. 42, Iss. 16, pp. 3005–3008 (2003)
  • Ana M. de Paula, Claudilene R. Chaves, Haroldo B. Silva, and Gerald Weber

  • Applied Optics, Vol. 42, Iss. 16, pp. 3009–3017 (2003)
  • Michael Shribak and Rudolf Oldenbourg

  • Applied Optics, Vol. 42, Iss. 16, pp. 3018–3026 (2003)
  • Nabeel A. Riza and Zahid Yaqoob

  • Applied Optics, Vol. 42, Iss. 16, pp. 3027–3037 (2003)
  • Alexander I. Kholodnykh, Irina Y. Petrova, Kirill V. Larin, Massoud Motamedi, and Rinat O. Esenaliev

  • Applied Optics, Vol. 42, Iss. 16, pp. 3038–3046 (2003)
  • Daniel L. Marks, Amy L. Oldenburg, J. Joshua Reynolds, and Stephen A. Boppart

  • Applied Optics, Vol. 42, Iss. 16, pp. 3047–3053 (2003)
  • David G. Hunter, Ankoor S. Shah, Soma Sau, Deborah Nassif, and David L. Guyton

  • Applied Optics, Vol. 42, Iss. 16, pp. 3054–3062 (2003)
  • Hideaki Koizumi, Tsuyoshi Yamamoto, Atsushi Maki, Yuichi Yamashita, Hiroki Sato, Hideo Kawaguchi, and Noriyoshi Ichikawa

  • Applied Optics, Vol. 42, Iss. 16, pp. 3063–3072 (2003)
  • Francesco Fabbri, Maria Angela Franceschini, and Sergio Fantini

  • Applied Optics, Vol. 42, Iss. 16, pp. 3073–3080 (2003)
  • Israel Gannot, Avital Garashi, Gallya Gannot, Victor Chernomordik, and Amir Gandjbakhche

  • Applied Optics, Vol. 42, Iss. 16, pp. 3081–3094 (2003)
  • Adam B. Milstein, Seungseok Oh, Kevin J. Webb, Charles A. Bouman, Quan Zhang, David A. Boas, and R. P. Millane

  • Applied Optics, Vol. 42, Iss. 16, pp. 3095–3108 (2003)
  • Alex H. Barnett, Joseph P. Culver, A. Gregory Sorensen, Anders Dale, and David A. Boas

  • Applied Optics, Vol. 42, Iss. 16, pp. 3109–3116 (2003)
  • Adam Gibson, Roza Md. Yusof, Hamid Dehghani, Jason Riley, Nick Everdell, Robin Richards, Jeremy C. Hebden, Martin Schweiger, Simon R. Arridge, and David T. Delpy

  • Applied Optics, Vol. 42, Iss. 16, pp. 3117–3128 (2003)
  • Hamid Dehghani, Brian W. Pogue, Jiang Shudong, Ben Brooksby, and Keith D. Paulsen

  • Applied Optics, Vol. 42, Iss. 16, pp. 3129–3144 (2003)
  • Misha E. Kilmer, Eric L. Miller, Alethea Barbaro, and David Boas

  • Applied Optics, Vol. 42, Iss. 16, pp. 3145–3153 (2003)
  • Lorenzo Spinelli, Alessandro Torricelli, Antonio Pifferi, Paola Taroni, and Rinaldo Cubeddu

  • Applied Optics, Vol. 42, Iss. 16, pp. 3154–3162 (2003)
  • Jonathan J. Stott, Joseph P. Culver, Simon R. Arridge, and David A. Boas

  • Applied Optics, Vol. 42, Iss. 16, pp. 3163–3169 (2003)
  • Yong Xu, Xuejun Gu, Laurie L. Fajardo, and Huabei Jiang

  • Applied Optics, Vol. 42, Iss. 16, pp. 3170–3186 (2003)
  • Dirk Grosenick, K. Thomas Moesta, Heidrun Wabnitz, Jörg Mucke, Christian Stroszczynski, Rainer Macdonald, Peter M. Schlag, and Herbert Rinneberg

  • Applied Optics, Vol. 42, Iss. 16, pp. 3187–3197 (2003)
  • Paulo R. Bargo, Scott A. Prahl, and Steven L. Jacques

  • Applied Optics, Vol. 42, Iss. 16, pp. 3198–3204 (2003)
  • Yohei Watanabe and Eiji Okada

  • Applied Optics, Vol. 42, Iss. 16, pp. 3205–3214 (2003)
  • Brett A. Hooper, Anjul Maheshwari, Adam C. Curry, and Todd M. Alter

  • Applied Optics, Vol. 42, Iss. 16, pp. 3215–3224 (2003)
  • John A. Viator, Bernard Choi, Martin Ambrose, Jerome Spanier, and J. Stuart Nelson

  • Applied Optics, Vol. 42, Iss. 16, pp. 3225–3233 (2003)
  • Samuel T. Thurman and G. Michael Morris

  • Applied Optics, Vol. 42, Iss. 16, pp. 3234–3240 (2003)
  • John R. Marciante, Nestor O. Farmiga, Jeffrey I. Hirsh, Michelle S. Evans, and Hieu T. Ta

  • Applied Optics, Vol. 42, Iss. 16, pp. 3241–3250 (2003)
  • Bing Yu, Dae Woong Kim, Jiangdong Deng, Hai Xiao, and Anbo Wang

  • Applied Optics, Vol. 42, Iss. 16, pp. 3251–3258 (2003)
  • Gonzalo Paez and Marija Strojnik

  • Applied Optics, Vol. 42, Iss. 16, pp. 3259–3267 (2003)
  • Yasuyuki Unno

  • Applied Optics, Vol. 42, Iss. 16, pp. 3268–3270 (2003)
  • Marcelo B. Pereira and Flavio Horowitz

  • Applied Optics, Vol. 42, Iss. 16, pp. 3271–3276 (2003)
  • Won-Jae Joo, Hyunaee Chun, In Kyu Moon, and Nakjoong Kim

  • Applied Optics, Vol. 42, Iss. 16, pp. 3277–3283 (2003)
  • Thomas Ruckstuhl and Stefan Seeger

  • Applied Optics, Vol. 42, Iss. 16, pp. 3284–3289 (2003)
  • Pedro Arguijo and Marija Strojnik Scholl

  • Applied Optics, Vol. 42, Iss. 16, pp. 3290–3296 (2003)
  • Franck Jaillon and Hervé Saint-Jalmes

  • Applied Optics, Vol. 42, Iss. 16, pp. 3297–3304 (2003)
  • Satish Vitta, Martin Weisheit, and Hans-Ulrich Krebs

  • Applied Optics, Vol. 42, Iss. 16, pp. 3305–3312 (2003)
  • Stephen Padin

  • Applied Optics, Vol. 42, Iss. 16, pp. 3313–3320 (2003)
  • C. Virginie Zint, Wilfried Uhring, Murielle Torregrossa, Bernard Cunin, and Patrick Poulet

  • Applied Optics, Vol. 42, Iss. 16, pp. 3321–3329 (2003)
  • Xiaoyuan Deng and Min Gu
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