Abstract

A simple theoretical framework is used to calculate specular reflection spectra in the vicinity of an absorption band in a solid. The energy of the reflectivity peak is shown to differ from the energy of the absorption band even at normal incidence with thick samples and with thin film samples supported on a substrate. By considering the absorption band system of solid CO, synthetic reflection spectra of the Fourth Positive System of solid CO at 45° incidence are obtained that successfully match the experimental results, including striking time-dependent changes.

© 1974 Optical Society of America

Kramers-Kronig Analysis of Ratio Reflectance Spectra Measured at an Oblique Angle

Marvin R. Querry and Wayne E. Holland
Appl. Opt. 13(3) 595-598 (1974)

Interpretation of reflection and transmission spectra for thin films: transmission

Kiyoshi Yamamoto and Hatsuo Ishida
Appl. Opt. 34(21) 4177-4185 (1995)

Thickness of absorbing films necessary to measure their optical constants using the reflectance-vs-angle-of-incidence method

W. R. Hunter and G. Hass
J. Opt. Soc. Am. 64(4) 429-433 (1974)

Limits to the Detection of Small Internal Voids in Solids with Holographic Techniques

B. J. Pernick
Appl. Opt. 13(7) 1711-1722 (1974)

Some Theoretical Limitations of the Optical Power Spectrum Analyzer

K. R. Hessel
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