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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 17, Iss. 22 — Nov. 15, 1978
  • pp: 3529–3530

Alignment of a Fourier transform spectrometer for measuring high temperature reflectivities

D. M. Trotter, Jr. and E. A. Schiff  »View Author Affiliations


Applied Optics, Vol. 17, Issue 22, pp. 3529-3530 (1978)
http://dx.doi.org/10.1364/AO.17.003529


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No abstract available.

History
Original Manuscript: August 31, 1978
Published: November 15, 1978

Citation
D. M. Trotter and E. A. Schiff, "Alignment of a Fourier transform spectrometer for measuring high temperature reflectivities," Appl. Opt. 17, 3529-3530 (1978)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-17-22-3529


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References

  1. P. R. Griffiths, Chemical Fourier Transform Spectroscopy (Wiley, New York, 1975), pp. 10, 110, 172.
  2. Ref. 1, p. 123.
  3. W. H. Steel, Interferometry (Cambridge U. P., London, 1967), p. 57.
  4. R. J. Bell, Introductory Fourier Transform Spectroscopy (Academic, New York, 1972), p. 142ff.

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