Abstract

A detailed study of a new method of determining the optical properties of absorbing materials is presented. It makes use of normal incidence reflectances from the specimen itself (R_s) and from the specimen coated with a transparent film of two different thicknesses but of the same refractive index (R_1s and R_2s) in the form of R_1s/R_s and R_2s/R_s. It is seen that a simple goniometer can be easily adopted for measuring the reflectance ratios over a wide spectral range. The versatility of the method has been proved by the fact that it has been successfully adopted for specimens with surface structures varying from atomically smooth to rough surfaces.

© 1981 Optical Society of America

Determination of optical constants of absorbing materials using transmission and reflection of thin films on partially metallized substrates: analysis of the new (T,Rm) technique

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