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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 20, Iss. 20 — Oct. 15, 1981
  • pp: 3503–3507

Dynamic interferometry techniques for optical path length measurements

A. Olsson and C. L. Tang  »View Author Affiliations


Applied Optics, Vol. 20, Issue 20, pp. 3503-3507 (1981)
http://dx.doi.org/10.1364/AO.20.003503


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Abstract

Two dynamic interferometric techniques based on electrically tunable lasers are described and experimentally demonstrated. The first technique allows for measurements of small phase modulations in interferometers independently of dc drifts and low frequency noise in the interferometer. The second scheme is a true FM technique suited for continuous real-time noncontact measurements of the optical thickness of transparent materials.

© 1981 Optical Society of America

Citation
A. Olsson and C. L. Tang, "Dynamic interferometry techniques for optical path length measurements," Appl. Opt. 20, 3503-3507 (1981)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-20-20-3503

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