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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 22, Iss. 12 — Jun. 15, 1983
  • pp: 1820–1823

Ray tracing method for refractive index profiling

Dennis Gregoris and Keigo Iizuka  »View Author Affiliations


Applied Optics, Vol. 22, Issue 12, pp. 1820-1823 (1983)
http://dx.doi.org/10.1364/AO.22.001820


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Abstract

A technique is proposed to measure cylindrically symmetric refractive index profiles of transparent rods. A probe ray is incident to the side of the rod, and its emergent point is observed on an end surface of the rod. A simple relationship between incident and emergent ray positions is used to determine the index profile. The profile of a graded index rod lens was measured with an accuracy to within 1 part in 103. An extension of the method to a more general profile distribution is discussed.

© 1983 Optical Society of America

History
Original Manuscript: February 23, 1983
Published: June 15, 1983

Citation
Dennis Gregoris and Keigo Iizuka, "Ray tracing method for refractive index profiling," Appl. Opt. 22, 1820-1823 (1983)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-12-1820


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References

  1. D. Marcuse, Appl. Opt. 18, 9 (1979). [CrossRef] [PubMed]
  2. I. Sasaki, D. N. Payne, R. J. Mansfield, Appl. Opt. 21, 4256 (1982).
  3. Y. Kokubun, K. Iga, Appl. Opt. 21, 1030 (1982). [CrossRef] [PubMed]
  4. W. E. Martin, Appl. Opt. 13, 2112 (1974). [CrossRef] [PubMed]
  5. L. S. Watkins, Appl. Opt. 18, 2214 (1979). [CrossRef] [PubMed]
  6. D. Gregoris, K. Iizuka, Appl. Opt. 22, 424 (1982). [CrossRef]
  7. M. Born, E. Wolf, Principles of Optics (Pergamon, New York, 1980), p. 122.
  8. E. Marchand, Gradient Index Optics (Academic, New York, 1978), p. 56.
  9. R. M. Allen, Practical Refractometry (R.P. Cargille Laboratories Inc., Cedar Grove, N.J. 070091962).
  10. Nippon Sheet Glass America, Ltd.Clark, N.J.1980).

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