A noncontact optical technique for the measurement of thin-film thickness and surface roughness with 25-Å and 2-μm vertical and horizontal resolutions, respectively, has been described. It is based on a common-path three-beam shearing interferometer, in which the outer beams act as a reference while the middle beam scans the surface. The results of this technique are comparable with the ones obtained with a stylus instrument.
© 1983 Optical Society of America
Original Manuscript: July 16, 1982
Published: June 15, 1983
Kais Almarzouk, "Three-beam interferometric profilometer," Appl. Opt. 22, 1893-1897 (1983)