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Applied Optics

Applied Optics


  • Vol. 22, Iss. 14 — Jul. 15, 1983
  • pp: 2213–2216

Measuring birefringence properties using a wave plate and an analyzer

Stewart R. M. Robertson  »View Author Affiliations

Applied Optics, Vol. 22, Issue 14, pp. 2213-2216 (1983)

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The method of measuring birefringence properties using a quarterwave plate and an analyzer is examined, and explicit equations are derived for the case of a linear retarder and for a retarder–rotator system. These equations have been tested empirically by characterizing some previously known birefringent elements. In the case of a pure retarder agreement is generally better than 1°, while for retarder–rotator systems errors were typically 2° for retardation and between 1° and 2° for rotation. Possible sources of these errors are discussed.

© 1983 Optical Society of America

Original Manuscript: December 28, 1982
Published: July 15, 1983

Stewart R. M. Robertson, "Measuring birefringence properties using a wave plate and an analyzer," Appl. Opt. 22, 2213-2216 (1983)

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