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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 22, Iss. 15 — Aug. 1, 1983
  • pp: 2302–2307

Simultaneous determination of refractive index and size of spherical dielectric particles from light scattering data

Petr Chylek, V. Ramaswamy, A. Ashkin, and J. M. Dziedzic  »View Author Affiliations


Applied Optics, Vol. 22, Issue 15, pp. 2302-2307 (1983)
http://dx.doi.org/10.1364/AO.22.002302


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Abstract

The diameter and refractive index of micrometer sized spherical dielectric particles are simultaneously deduced using the wavelength dependence of backscattering data from optically levitated particles. The accuracy of the results is set by experimental errors in the determination of the wavelength of backscatter resonance peaks and the ratio of slopes of specified peaks. At present the refractive index and diameter can be deduced with relative errors of 5 × 10−5. This represents the most accurate determination of absolute size and refractive index yet made by light scattering. A reduction of these errors by an order of magnitude is possible. We assume a priori knowledge of diameter and refractive index with accuracy of 10−1 and 5 × 10−3, respectively.

© 1983 Optical Society of America

History
Original Manuscript: January 7, 1983
Published: August 1, 1983

Citation
Petr Chylek, V. Ramaswamy, A. Ashkin, and J. M. Dziedzic, "Simultaneous determination of refractive index and size of spherical dielectric particles from light scattering data," Appl. Opt. 22, 2302-2307 (1983)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-15-2302

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