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Applied Optics

Applied Optics


  • Vol. 22, Iss. 18 — Sep. 15, 1983
  • pp: 2850–2853

Fringe pattern recognition and interpolation using nonlinear regression analysis

John B. Schemm and Charles M. Vest  »View Author Affiliations

Applied Optics, Vol. 22, Issue 18, pp. 2850-2853 (1983)

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Least-square error criteria are used to fit 1-D interference fringe pattern irradiance data to a physically meaningful function of the form I(x) = B(x) + E(x) cos[P(x)], where B(x), E(x), and P(x) are low-order polynomials. This procedure is intended to complement digital fringe recognition by providing a method for smoothing and interpolating among fringe position data when the number of fringes is small, there are more than ten irradiance measurements per fringe, and accurate phase values are needed at arbitrary locations in the field.

© 1983 Optical Society of America

Original Manuscript: April 8, 1983
Published: September 15, 1983

John B. Schemm and Charles M. Vest, "Fringe pattern recognition and interpolation using nonlinear regression analysis," Appl. Opt. 22, 2850-2853 (1983)

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