Lower emissivity limits indicated for high temperature selective surfaces
Applied Optics, Vol. 22, Issue 20, pp. 3182-3190 (1983)
http://dx.doi.org/10.1364/AO.22.003182
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Abstract
Minimum emissivity limits given in the literature for high temperature selective surfaces may be too pessimistic. To reassess these limits, hypothetical bulk absorbing semiconductor-metal (SM) and semiconductor-insulator-metal (SIM) coatings were modeled using plausible high temperature semiconductor optical constants. Careful attention was paid to the positioning of the exponential region of the semiconductor absorption edge. Values of α/∊ may even be exceeded using interference effects to limit copper emissivity to below vacuum values.
© 1983 Optical Society of America
Citation
David R. Mills and L. C. Botten, "Lower emissivity limits indicated for high temperature selective surfaces," Appl. Opt. 22, 3182-3190 (1983)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-20-3182
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