Minimum emissivity limits given in the literature for high temperature selective surfaces may be too pessimistic. To reassess these limits, hypothetical bulk absorbing semiconductor-metal (SM) and semiconductor-insulator-metal (SIM) coatings were modeled using plausible high temperature semiconductor optical constants. Careful attention was paid to the positioning of the exponential region of the semiconductor absorption edge. Values of α/∊ may even be exceeded using interference effects to limit copper emissivity to below vacuum values.
© 1983 Optical Society of America
David R. Mills and L. C. Botten, "Lower emissivity limits indicated for high temperature selective surfaces," Appl. Opt. 22, 3182-3190 (1983)