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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 22, Iss. 21 — Nov. 1, 1983
  • pp: 3414–3420

Wavelength ratio of stabilized laser radiation at 3.39 μm and 0.633 μm

G. Bönsch  »View Author Affiliations


Applied Optics, Vol. 22, Issue 21, pp. 3414-3420 (1983)
http://dx.doi.org/10.1364/AO.22.003414


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Abstract

A servo controlled Michelson interferometer with a displacement of 3.8 m between the final positions of the movable mirror has been developed for precise laser wavelength comparisons. This instrument has been used to determine the wavelength ratio between the radiation of a 3.39-μm He–Ne laser stabilized to the CH4 transition ν3, P(7), component F 2 ( 2 ) and that of a 633-nm He–Ne laser stabilized to the 127I2 transition 11–5, R(127), component i. Expanded laser beams of Gaussian structure were used and the diffraction correction for the infrared beam was determined from measured beam parameters. Two series of measurements were carried out, approximating measurements with the total cross section and with only the central part of the beam. The results confirm the expected change of the diffraction correction. The weighted mean value of both measurement series yields λCH4I2 = 5.359 048 1743 (1 ± 3 × 10−10).

© 1983 Optical Society of America

History
Original Manuscript: June 7, 1983
Published: November 1, 1983

Citation
G. Bönsch, "Wavelength ratio of stabilized laser radiation at 3.39 μm and 0.633 μm," Appl. Opt. 22, 3414-3420 (1983)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-21-3414

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