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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 22, Iss. 23 — Dec. 1, 1983
  • pp: 3898–3901

Two-dimensional fringe-pattern analysis

William W. Macy, Jr.  »View Author Affiliations


Applied Optics, Vol. 22, Issue 23, pp. 3898-3901 (1983)
http://dx.doi.org/10.1364/AO.22.003898


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Abstract

Two-dimensional sinusoid fitting and Fourier transform methods of analyzing fringes to determine the wave-front topography are described. The methods are easy to apply because they do not require finding fringe centers and fringe orders. Also, they are accurate. For an active optics experiment in which we have used these techniques, experimental noise exceeds the error resulting from analysis of noise-free theoretical fringe patterns.

© 1983 Optical Society of America

History
Original Manuscript: June 30, 1983
Published: December 1, 1983

Citation
William W. Macy, "Two-dimensional fringe-pattern analysis," Appl. Opt. 22, 3898-3901 (1983)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-23-3898


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