Photometric measurement of linear crystallization velocity on a microscale
Applied Optics, Vol. 22, Issue 4, pp. 619-621 (1983)
http://dx.doi.org/10.1364/AO.22.000619
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Abstract
Use of a photometer-equipped polarizing microscope permits the measurement of linear crystallization velocity in a flexible manner. Ease of sample preparation and manipulation compared with conventional methods for measuring crystallization velocity are among the advantages of the method reported here. A simple barrier layer silicon photodetector in short-circuit operation gives the fast response necessary to follow the moving solid-liquid interface. Sample results on the crystallization of α- and β-resorcinol illustrate the utility of this method.
© 1983 Optical Society of America
Citation
L. J. Soltzberg, Yvette M. Dick, and Jody M. Stowe, "Photometric measurement of linear crystallization velocity on a microscale," Appl. Opt. 22, 619-621 (1983)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-4-619
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