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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 22, Iss. 4 — Feb. 15, 1983
  • pp: 619–621

Photometric measurement of linear crystallization velocity on a microscale

L. J. Soltzberg, Yvette M. Dick, and Jody M. Stowe  »View Author Affiliations


Applied Optics, Vol. 22, Issue 4, pp. 619-621 (1983)
http://dx.doi.org/10.1364/AO.22.000619


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Abstract

Use of a photometer-equipped polarizing microscope permits the measurement of linear crystallization velocity in a flexible manner. Ease of sample preparation and manipulation compared with conventional methods for measuring crystallization velocity are among the advantages of the method reported here. A simple barrier layer silicon photodetector in short-circuit operation gives the fast response necessary to follow the moving solid–liquid interface. Sample results on the crystallization of α- and β-resorcinol illustrate the utility of this method.

© 1983 Optical Society of America

History
Original Manuscript: October 21, 1982
Published: February 15, 1983

Citation
L. J. Soltzberg, Yvette M. Dick, and Jody M. Stowe, "Photometric measurement of linear crystallization velocity on a microscale," Appl. Opt. 22, 619-621 (1983)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-4-619

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