Use of a photometer-equipped polarizing microscope permits the measurement of linear crystallization velocity in a flexible manner. Ease of sample preparation and manipulation compared with conventional methods for measuring crystallization velocity are among the advantages of the method reported here. A simple barrier layer silicon photodetector in short-circuit operation gives the fast response necessary to follow the moving solid–liquid interface. Sample results on the crystallization of α- and β-resorcinol illustrate the utility of this method.
© 1983 Optical Society of America
Original Manuscript: October 21, 1982
Published: February 15, 1983
L. J. Soltzberg, Yvette M. Dick, and Jody M. Stowe, "Photometric measurement of linear crystallization velocity on a microscale," Appl. Opt. 22, 619-621 (1983)