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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 22, Iss. 8 — Apr. 15, 1983
  • pp: 1241–1246

Uniform and graded multilayers as x-ray optical elements

Ping Lee  »View Author Affiliations


Applied Optics, Vol. 22, Issue 8, pp. 1241-1246 (1983)
http://dx.doi.org/10.1364/AO.22.001241


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Abstract

A detailed comparison of the performance of uniform and graded multilayers as soft x-ray monochromators and normal incidence collectors has been made. In particular, the responses of flat depth-, and laterally graded multilayers to Al Kα radiation, λ = 8.34 Å, have been computed and compared with the corresponding uniform multilayer. Furthermore, the efficiency of graded and uniform multilayers as normal incidence x-ray collectors has been calculated in terms of effective areas for parabolic reflectors tuned to the O Kα line, λ = 23.7 Å. Finally, the effective areas of four strong solar emission lines in the 30–60 Å region have been computed for uniform multilayers. Normal incidence multilayer mirrors are well suited for spectroheliograph type of applications.

© 1983 Optical Society of America

History
Original Manuscript: November 26, 1982
Published: April 15, 1983

Citation
Ping Lee, "Uniform and graded multilayers as x-ray optical elements," Appl. Opt. 22, 1241-1246 (1983)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-8-1241


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References

  1. T. W. Barbee, in Proceedings of the Topical Conference on Low Energy X-Ray Diagnostics, D. T. Attwood, B. L. Henke, Eds. (American Institute of Physics, New York, 1981); I. K. Schuller, Phys. Rev. Lett. 44, 1597 (1980). [CrossRef]
  2. E. Spiller, A. Segmuller, J. Rife, R-P. Haelbich, Appl. Phys. Lett. 37, 1048 (1980). [CrossRef]
  3. S. V. Gaponov, S. A. Gusev, B. M. Luskin, N. N. Salashchenko, Opt. Commun. 38, 7 (1981);see also Refs. 1 and 2. [CrossRef]
  4. J. H. Underwood, T. W. Barbee, Nature 294, 429 (1981). [CrossRef]
  5. J. P. Henry, E. Spiller, M. Weisskopf, Appl. Phys. Lett. 40, 25 (1982). [CrossRef]
  6. D. J. Nagel, T. W. Barbee, J. V. Gilfrich, Nucl. Instrum. Methods 195, 63 (1982). [CrossRef]
  7. A. E. Rosenbluth, J. M. Forsyth, in Proceedings of the Topical Conference on Low Energy X-Ray Diagnostics, D. T. Attwood, B. L. Henke, Eds. (American Institute of Physics, New York, 1981); J. H. Underwood, T. W. Barbee, in same Proceedings.
  8. P. Lee, Opt. Commun. 37, 159 (1981). [CrossRef]
  9. Detailed discussions of the matrix A and AN for bilayer systems are given in Ref. 8 and P. Lee, Opt. Commun. 43, 237 (1982). [CrossRef]
  10. B. L. Henke, P. Lee, T. J. Tanaka, R. L. Shimabukuru, B. K. Fujikawa, Atomic and Nuclear Data Table 27 (1982).
  11. J. H. Underwood, T. W. Barbee, D. L. Shealy, Proc. Soc. Photo-Opt. Instrum. Eng. 316, 79 (1981).
  12. W. E. Austin, J. D. Purcell, R. Tousey, K. G. Widing, Astrophys. 145, 373 (1966). [CrossRef]

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