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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 24, Iss. 12 — Jun. 15, 1985
  • pp: 1788–1798

Determination of the optical constants of a thin film from transmittance measurements of a single film thickness

Kent F. Palmer and Michael Z. Williams  »View Author Affiliations


Applied Optics, Vol. 24, Issue 12, pp. 1788-1798 (1985)
http://dx.doi.org/10.1364/AO.24.001788


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Abstract

A subtractive Kramers-Kronig method is presented for obtaining the optical constants, n and k, of a uniform absorbing film on a substrate using the transmittance spectrum of a single film thickness. We give the results of tests on the reliability of our method, demonstrate the usefulness of the method when only transmittance data are available, and give examples of thin films whose optical constants depend on their thickness.

© 1985 Optical Society of America

History
Original Manuscript: November 2, 9199
Published: June 15, 1985

Citation
Kent F. Palmer and Michael Z. Williams, "Determination of the optical constants of a thin film from transmittance measurements of a single film thickness," Appl. Opt. 24, 1788-1798 (1985)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-24-12-1788

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