Use of a two hololens imaging system in speckle metrology is studied in detail. Theoretical analysis and experimental investigations reveal that an almost diffraction-limited performance in speckle metrology can be achieved over the entire object field that can be imaged by this hololens configuration.
© 1987 Optical Society of America
Chandra Shakher and G. Venkata Rao, "Use of holographic optical elements in speckle metrology: part 2," Appl. Opt. 26, 654-657 (1987)