Use of holographic optical elements in speckle metrology: part 2
Applied Optics, Vol. 26, Issue 4, pp. 654-657 (1987)
http://dx.doi.org/10.1364/AO.26.000654
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Abstract
Use of a two hololens imaging system in speckle metrology is studied in detail. Theoretical analysis and experimental investigations reveal that an almost diffraction-limited performance in speckle metrology can be achieved over the entire object field that can be imaged by this hololens configuration.
© 1987 Optical Society of America
Citation
Chandra Shakher and G. Venkata Rao, "Use of holographic optical elements in speckle metrology: part 2," Appl. Opt. 26, 654-657 (1987)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-26-4-654
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