Abstract

Within various x-ray programs there exists a need for a detailed investigation of the surface roughness of mirrored surfaces over a wide spatial wavelength bandwidth, ranging from large scale figure error to microroughness. A number of methods exist to measure the surface roughness. Common to all methods is that they are bandwidth-limited. A crucial point in the analysis of data is, therefore, to specify accurately the wavelength bandwidth limitation and to determine the surface autocorrelation function within this bandwidth. We present a number of scattering measurements obtained using a triple-axis perfect-crystal x-ray diffractometer and the results of an autocorrelation function analysis. Furthermore, we present some measurements of integrated reflectivity, which we believe provide evidence for microroughness in the range from a few angstroms to tens of microns.

© 1988 Optical Society of America

Design, construction, and performance of the ROSAT high-resolution x-ray mirror assembly

Bernd Aschenbach
Appl. Opt. 27(8) 1404-1413 (1988)

Extreme UV and x-ray scattering measurements from a rough LiF crystal surface characterized by electron micrography

Najib Alehyane, Mohammed Arbaoui, Robert Barchewitz, Jean-Michel André, Finn E. Christensen, Allan Hornstrup, Jacqueline Palmari, Monique Rasigni, Réné Rivoira, and Georges Rasigni
Appl. Opt. 28(10) 1763-1772 (1989)

Measurements of mosaicity and perfection of crystallites in commercially available crystals using a 4-axis perfect-crystal x-ray diffractometer

Finn E. Christensen, Kulinder P. Singh, Niels J. Westergaard, and Herbert W. Schnopper
Appl. Opt. 26(2) 235-240 (1987)

Soft x-ray scattering from rough surfaces: experimental and theoretical analysis

Henning Hogrefe and Christof Kunz
Appl. Opt. 26(14) 2851-2859 (1987)

X-ray focusing using microchannel plates

P. Kaaret, P. Geissbuhler, A. Chen, and E. Glavinas
Appl. Opt. 31(34) 7339-7343 (1992)