Abstract

In this paper we extend and study the method for generating contours of diffuse objects employing a dual beam illumination coupled with electronic speckle pattern interferometry. The sensitivity and the orientation of the contour planes are analyzed. A novel method for tilting the planes of contours and experimental results incorporating phase shifting and fringe analysis are also presented. The theoretical and the experimental results show good agreement.

© 1990 Optical Society of America

Geometry for contouring by electronic speckle pattern interferometry based on shifting illumination beams

Y. Zou, H. Diao, X. Peng, and H. Tiziani
Appl. Opt. 31(31) 6616-6621 (1992)

Electronic speckle contouring

R. Rodríguez-Vera, D. Kerr, and F. Mendoza-Santoyo
J. Opt. Soc. Am. A 9(11) 2000-2008 (1992)

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Contouring by electronic speckle pattern interferometry with quadruple-beam illumination

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