A theoretical method is described from which the thickness of an arbitrary layer in a dielectric multilayer stack is determined if all other thicknesses and all refractive indices are given, such that a prescribed effective index for a given mode of the stack is obtained. The same theory can determine the optimal cover thickness of such a stack for prism coupling. Experimental verification shows effective indices that are in agreement with the designed values.
© 1990 Optical Society of America
H. J. Frankena, J. de Jong, H. Oltmans, and H. van Brug, "Thickness matching in planar multilayer waveguides," Appl. Opt. 29, 2320-2324 (1990)