Abstract

Rate equations have been used to analyze the variations of the outputs from the facets of the diodes being coated during the antireflection-coating process. Good agreement between the experimental recordings and theoretical predictions has been achieved. As a result, an auxiliary criterion for on-time assessment of the antireflection coating has been established.

© 1991 Optical Society of America

Directly controlled deposition of antireflection coatings for semiconductor lasers

M. Serenyi and H.-U. Habermeier
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