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Index of refraction measurement on sapphire at low temperatures and visible wavelengths

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Abstract

The ordinary and extraordinary refractive index of two samples of sapphire, which differed in the way each was grown, was measured. The measurements were made over a wavelength range of 477–701 nm and a temperature range of 20–295 K. A three-term Sellmeier dispersion equation was fit to the data to permit refractive-index interpolation within several parts in 104. The data of index versus temperature were fit to a model and the results of dn/dT versus temperature are given along with certain physical constants that were extracted from the model.

© 1993 Optical Society of America

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